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Distributed control in testable high-level synthesis with low area and power overhead

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dc.contributor.author Harmanani, Harmanani
dc.contributor.author Marrouche, Wissam
dc.date.accessioned 2017-03-30T08:59:05Z
dc.date.available 2017-03-30T08:59:05Z
dc.date.issued 2017-03-30
dc.identifier.isbn 0-7803-8322-2 en_US
dc.identifier.uri http://hdl.handle.net/10725/5461
dc.description.abstract This work presents a method for distributed test control in coordination with testable data path allocation in high-level synthesis. The method aims at creating distributed test controllers for synthesized data paths with the aim of minimizing area and power consumption. The distributed controllers are designed to be small and mounted next to their corresponding test kernels. Thus, every test kernel in the datapath has its own test controller in addition to a relatively small controller that synchronizes the distributed controllers. The system has been implemented using C++ and favorable results are reported. en_US
dc.language.iso en en_US
dc.publisher IEEE en_US
dc.title Distributed control in testable high-level synthesis with low area and power overhead en_US
dc.type Conference Paper / Proceeding en_US
dc.author.school SAS en_US
dc.author.idnumber 199490170 en_US
dc.author.department Computer Science and Mathematics en_US
dc.description.embargo N/A en_US
dc.keywords Distributed control en_US
dc.keywords High level synthesis en_US
dc.keywords Circuit testing en_US
dc.keywords System testing en_US
dc.keywords Kernel en_US
dc.keywords Clocks en_US
dc.keywords Automatic control en_US
dc.keywords Control system synthesis en_US
dc.keywords Circuit synthesis en_US
dc.keywords Built-in self-test en_US
dc.identifier.doi http://dx.doi.org/10.1109/NEWCAS.2004.1359018 en_US
dc.identifier.ctation Harmanani, H., & Marrouche, W. (2004, June). Distributed control in testable high-level synthesis with low area and power overhead. In Circuits and Systems, 2004. NEWCAS 2004. The 2nd Annual IEEE Northeast Workshop on (pp. 65-68). IEEE. en_US
dc.author.email haidar.harmanani@lau.edu.lb en_US
dc.conference.date 20-23 June 2004 en_US
dc.conference.pages 65-68 en_US
dc.conference.title The 2nd Annual IEEE Northeast Workshop on Circuits and Systems, 2004 en_US
dc.identifier.tou http://libraries.lau.edu.lb/research/laur/terms-of-use/articles.php en_US
dc.identifier.url http://ieeexplore.ieee.org/abstract/document/1359018/ en_US
dc.orcid.id https://orcid.org/0000-0001-8488-6555 en_US
dc.author.affiliation Lebanese American University en_US


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