A hybrid distributed test generation method using deterministic and genetic algorithms

Harmanani, H.; Karablieh, B.

A hybrid distributed test generation method using deterministic and genetic algorithms

Harmanani, H.; Karablieh, B.

URI: http://hdl.handle.net/10725/5460

URL: http://ieeexplore.ieee.org/abstract/document/1530964/

DOI: http://dx.doi.org/10.1109/IWSOC.2005.13

Date: 2017-03-30

Terms of Use: This item is made available under the terms and conditions applicable to " Conference Paper / Proceeding ", as set forth at: http://libraries.lau.edu.lb/research/laur/terms-of-use/articles.php

Abstract:

Test generation is a highly complex and time-consuming task. In this work, we present a distributed method for combinational test generation. The method is based on a hybrid approach that combines both deterministic and genetic approaches. The deterministic phase is based on the D-algorithm and generates an initial set of test vectors that are evolved in the genetic phase in order to achieve high fault coverage in a short time. The algorithm is parallelized based on a cluster of workstations using the message passing interface (MPI) library. Several benchmark circuits were attempted, and favorable results comparisons are reported

Citation:

Harmanani, H., & Karablieh, B. (2005, July). A hybrid distributed test generation method using deterministic and genetic algorithms. In System-on-Chip for Real-Time Applications, 2005. Proceedings. Fifth International Workshop on (pp. 317-322). IEEE.