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A method for optimizing test bus assignment and sizing for system-on-a-chip

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dc.contributor.author Harmanani, Haidar M.
dc.contributor.author Sawan, Rachel
dc.date.accessioned 2017-03-29T10:27:22Z
dc.date.available 2017-03-29T10:27:22Z
dc.date.issued 2017-03-29
dc.identifier.isbn 1-4244-1020-7 en_US
dc.identifier.uri http://hdl.handle.net/10725/5456
dc.description.abstract Test access mechanism (TAM) is an important element of test access architectures for embedded cores and is responsible for on-chip test patterns transport from the source to the core under test to the sink. Efficient TAM design is of critical importance in SOC system integration since it directly impacts testing time and cost. In this paper, we propose an efficient genetic algorithm to design test access architectures while investigating test bus sizing and assignment of cores to test buses in the system. We present experimental results that demonstrate the effectiveness of our method while outperforming reported techniques. en_US
dc.language.iso en en_US
dc.publisher IEEE en_US
dc.title A method for optimizing test bus assignment and sizing for system-on-a-chip en_US
dc.type Conference Paper / Proceeding en_US
dc.author.school SAS en_US
dc.author.idnumber 199490170 en_US
dc.author.department Computer Science and Mathematics en_US
dc.description.embargo N/A en_US
dc.keywords Optimization methods en_US
dc.keywords System testing en_US
dc.keywords System-on-a-chip en_US
dc.keywords Logic testing en_US
dc.keywords Genetic algorithms en_US
dc.keywords Algorithm design and analysis en_US
dc.keywords Computer science en_US
dc.keywords Mathematics en_US
dc.keywords Computer architecture en_US
dc.keywords Costs en_US
dc.identifier.doi http://dx.doi.org/10.1109/CCECE.2007.30 en_US
dc.identifier.ctation Harmanani, H. M., & Sawan, R. (2007, April). A Method for Optimizing Test Bus Assignment and Sizing for System-on-a-Chip. In Electrical and Computer Engineering, 2007. CCECE 2007. Canadian Conference on (pp. 90-94). IEEE. en_US
dc.author.email haidar.harmanani@lau.edu.lb en_US
dc.conference.date 22-26 April 2007 en_US
dc.conference.pages 90-94 en_US
dc.conference.place Region 07 - Canada en_US
dc.conference.title Canadian Conference on Electrical and Computer Engineering, 2007 en_US
dc.identifier.tou http://libraries.lau.edu.lb/research/laur/terms-of-use/articles.php en_US
dc.identifier.url http://ieeexplore.ieee.org/abstract/document/4232689/ en_US
dc.author.affiliation Lebanese American University en_US


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