An Ant Colony Optimization approach for test pattern generation

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dc.contributor.author Harmanani, Haidar M.
dc.date.accessioned 2017-03-29T10:18:27Z
dc.date.available 2017-03-29T10:18:27Z
dc.date.issued 2017-03-29
dc.identifier.isbn 978-1-4244-1642-4 en_US
dc.identifier.uri http://hdl.handle.net/10725/5455
dc.description.abstract Test pattern generation is a challenging problem that has an exponential complexity that is aggravated with the continuos increase in circuits size. This paper deals with automatic test pattern generation (ATPG) for combinational circuits, and proposes a new approach based on Ant Colony Optimization (ACO). The paper studies the opportunities offered by ACO in comparison with other simulated-based ATPGs. The method is implemented and is shown to efficiently generate a set of test vectors that achieve a high fault coverage in a short time. Several benchmark circuits are attempted, and favorable results comparisons are reported en_US
dc.language.iso en en_US
dc.publisher IEEE en_US
dc.title An Ant Colony Optimization approach for test pattern generation en_US
dc.type Conference Paper / Proceeding en_US
dc.author.school SAS en_US
dc.author.idnumber 199490170 en_US
dc.author.department Computer Science and Mathematics en_US
dc.description.embargo N/A en_US
dc.keywords Ant colony optimization en_US
dc.keywords Test pattern generators en_US
dc.keywords Circuit faults en_US
dc.keywords Automatic test pattern generation en_US
dc.keywords Circuit testing en_US
dc.keywords Circuit simulation en_US
dc.keywords Logic circuits en_US
dc.keywords Genetics en_US
dc.keywords Computer science en_US
dc.keywords Mathematics en_US
dc.identifier.doi http://dx.doi.org/10.1109/CCECE.2008.4564771 en_US
dc.identifier.ctation Farah, R., & Harmanani, H. M. (2008, May). An Ant Colony Optimization approach for test pattern generation. In Electrical and Computer Engineering, 2008. CCECE 2008. Canadian Conference on (pp. 001397-001402). IEEE. en_US
dc.author.email haidar.harmanani@lau.edu.lb en_US
dc.conference.date 4-7 May 2008 en_US
dc.conference.pages 001397-001402 en_US
dc.conference.place Region 07 - Canada en_US
dc.conference.title Canadian Conference on Electrical and Computer Engineering, 2008 en_US
dc.identifier.tou http://libraries.lau.edu.lb/research/laur/terms-of-use/articles.php en_US
dc.identifier.url http://ieeexplore.ieee.org/abstract/document/4564771/ en_US
dc.author.affiliation Lebanese American University en_US

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