Integrating wrapper design, TAM assignment, and test scheduling for SOC test optimization

Harmanani, Haidar M.; Farah, Rana

dc.contributor.author	Harmanani, Haidar M.
dc.contributor.author	Farah, Rana
dc.date.accessioned	2017-03-29T08:52:31Z
dc.date.available	2017-03-29T08:52:31Z
dc.date.issued	2017-03-29
dc.identifier.isbn	978-1-4244-2331-6	en_US
dc.identifier.uri	http://hdl.handle.net/10725/5453
dc.description.abstract	Test time minimization for core-based designs is tightly integrated with wrapper design and TAM capacity. This paper presents a method to determine minimum SOC test schedules with wrapper design and TAM optimization based on simulated annealing. The method can handle SOC test scheduling with and without power constraints in addition to precedence constraints that preserve desirable orderings among tests. We present experimental results using the ITC 2002 benchmarks.	en_US
dc.language.iso	en	en_US
dc.publisher	IEEE	en_US
dc.title	Integrating wrapper design, TAM assignment, and test scheduling for SOC test optimization	en_US
dc.type	Conference Paper / Proceeding	en_US
dc.author.school	SAS	en_US
dc.author.idnumber	199490170	en_US
dc.author.department	Computer Science and Mathematics	en_US
dc.description.embargo	N/A	en_US
dc.keywords	Magnetic cores	en_US
dc.keywords	System-on-a-chip	en_US
dc.keywords	Schedules	en_US
dc.keywords	Algorithm design and analysis	en_US
dc.keywords	Scheduling	en_US
dc.keywords	Simulated annealing	en_US
dc.keywords	Scheduling algorithm	en_US
dc.identifier.doi	http://dx.doi.org/10.1109/NEWCAS.2008.4606343	en_US
dc.identifier.ctation	Harmanani, H. M., & Farah, R. (2008, June). Integrating wrapper design, TAM assignment, and test scheduling for SOC test optimization. In Circuits and Systems and TAISA Conference, 2008. NEWCAS-TAISA 2008. 2008 Joint 6th International IEEE Northeast Workshop on (pp. 149-152). IEEE.	en_US
dc.author.email	haidar.harmanani@lau.edu.lb	en_US
dc.conference.date	22-25 June 2008	en_US
dc.conference.pages	149-152	en_US
dc.conference.title	2008 Joint 6th International IEEE Northeast Workshop on Circuits and Systems and TAISA Conference	en_US
dc.identifier.tou	http://libraries.lau.edu.lb/research/laur/terms-of-use/articles.php	en_US
dc.identifier.url	http://ieeexplore.ieee.org/abstract/document/4606343/	en_US
dc.author.affiliation	Lebanese American University	en_US