Estimating test cost during data path and controller synthesis with low power overhead

Harmanani, Haidar M.; Kodeih, Maya

dc.contributor.author	Harmanani, Haidar M.
dc.contributor.author	Kodeih, Maya
dc.date.accessioned	2017-03-29T08:27:07Z
dc.date.available	2017-03-29T08:27:07Z
dc.date.issued	2017-03-29
dc.identifier.isbn	978-1-4244-5377-1	en_US
dc.identifier.uri	http://hdl.handle.net/10725/5452
dc.description.abstract	This paper presents a method for concurrent BIST cost estimation during testable data path allocation. The method integrates testability in the design process and generates a distributed test controller that aims to minimize area and power. The system has been implemented and favorable results are reported.	en_US
dc.language.iso	en	en_US
dc.publisher	IEEE	en_US
dc.title	Estimating test cost during data path and controller synthesis with low power overhead	en_US
dc.type	Conference Paper / Proceeding	en_US
dc.author.school	SAS	en_US
dc.author.idnumber	199490170	en_US
dc.author.department	Computer Science and Mathematics	en_US
dc.description.embargo	N/A	en_US
dc.keywords	Registers	en_US
dc.keywords	Built-in self-test	en_US
dc.keywords	Kernel	en_US
dc.keywords	Clocks	en_US
dc.keywords	Resource management	en_US
dc.keywords	Finite impulse	en_US
dc.keywords	Response filter	en_US
dc.keywords	Logic gates	en_US
dc.identifier.doi	http://dx.doi.org/10.1109/CCECE.2010.5575139	en_US
dc.identifier.ctation	Harmanani, H. M., & Kodeih, M. (2010, May). Estimating test cost during data path and controller synthesis with low power overhead. In Electrical and Computer Engineering (CCECE), 2010 23rd Canadian Conference on (pp. 1-5). IEEE.	en_US
dc.author.email	haidar.harmanani@lau.edu.lb	en_US
dc.conference.date	2-5 May 2010	en_US
dc.conference.pages	1-5	en_US
dc.conference.place	Calgary, AB, Canada	en_US
dc.conference.title	2010 23rd Canadian Conference on Electrical and Computer Engineering	en_US
dc.identifier.tou	http://libraries.lau.edu.lb/research/laur/terms-of-use/articles.php	en_US
dc.identifier.url	http://ieeexplore.ieee.org/abstract/document/5575139/	en_US
dc.author.affiliation	Lebanese American University	en_US