An approach for redesign for testability at the register-transfer level

Harmanani, Haidar M.; Harfoush, Salam

dc.contributor.author	Harmanani, Haidar M.
dc.contributor.author	Harfoush, Salam
dc.date.accessioned	2017-02-08T13:42:28Z
dc.date.available	2017-02-08T13:42:28Z
dc.date.copyright	2000	en_US
dc.date.issued	2017-02-08
dc.identifier.issn	0840-8688	en_US
dc.identifier.uri	http://hdl.handle.net/10725/5201
dc.language.iso	en	en_US
dc.title	An approach for redesign for testability at the register-transfer level	en_US
dc.type	Article	en_US
dc.description.version	Published	en_US
dc.author.school	SAS	en_US
dc.author.idnumber	199490170	en_US
dc.author.department	Computer Science and Mathematics	en_US
dc.description.embargo	N/A	en_US
dc.relation.journal	Canadian Journal of Electrical and Computer Engineering	en_US
dc.journal.volume	25	en_US
dc.journal.issue	4	en_US
dc.article.pages	163-168	en_US
dc.identifier.ctation	Harmanani, H. M., & Harfoush, S. (2000). An approach for redesign for testability at the register-transfer level. Canadian Journal of Electrical and Computer Engineering, 25(4), 163-168.	en_US
dc.author.email	haidar.harmanani@lau.edu.lb	en_US
dc.identifier.tou	http://libraries.lau.edu.lb/research/laur/terms-of-use/articles.php	en_US
dc.author.affiliation	Lebanese American University	en_US