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An approach for redesign for testability at the register-transfer level

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An approach for redesign for testability at the register-transfer level

Harmanani, Haidar M.; Harfoush, Salam
URI: http://hdl.handle.net/10725/5201
Date: 2017-02-08
Terms of Use: This item is made available under the terms and conditions applicable to " Article ", as set forth at: http://libraries.lau.edu.lb/research/laur/terms-of-use/articles.php

Citation:

Harmanani, H. M., & Harfoush, S. (2000). An approach for redesign for testability at the register-transfer level. Canadian Journal of Electrical and Computer Engineering, 25(4), 163-168.

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