A model for low-energy thick-target bremsstrahlung produced in a scanning electron microscope

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dc.contributor.author Semaan, Mars
dc.contributor.author Quarles, C.A.
dc.date.accessioned 2016-04-18T12:10:10Z
dc.date.available 2016-04-18T12:10:10Z
dc.date.copyright 2001
dc.date.issued 2016-04-18
dc.identifier.issn 1097-4539 en_US
dc.identifier.uri http://hdl.handle.net/10725/3600
dc.description.abstract Thick-target bremsstrahlung measurements were obtained for various atomic numbers and for energies between 10 and 25 keV. A Jeol JSM 6100 scanning electron microscope was used for the electron beam and a Oxford Instruments Link Si(Li) detector for the bremsstrahlung spectrum. The experimental data were compared with a model that computes the thick-target bremsstrahlung spectrum by integrating the tabulated relativistic partial-wave doubly differential cross-section for thin-target bremsstrahlung over the target taking electron energy loss into account in the continuous slowing down approximation. The model corrects for electron backscattering, x-ray attenuation in the target and the efficiency of the x-ray detector. Very good agreement was found between the model and the experimental results. Extension of the model to consider multiple scattering in the target is also discussed. Copyright © 2001 John Wiley & Sons, Ltd. en_US
dc.language.iso en en_US
dc.title A model for low-energy thick-target bremsstrahlung produced in a scanning electron microscope en_US
dc.type Article en_US
dc.description.version Published en_US
dc.author.school SAS en_US
dc.author.idnumber 199690260 en_US
dc.author.woa N/A en_US
dc.author.department Natural Sciences en_US
dc.description.embargo N/A en_US
dc.relation.journal X-Ray Spectrometry en_US
dc.journal.volume 30 en_US
dc.journal.issue 1 en_US
dc.article.pages 37-43 en_US
dc.identifier.doi http://dx.doi.org/10.1002/xrs.465 en_US
dc.identifier.ctation Semaan, M., & Quarles, C. A. (2001). A model for low‐energy thick‐target bremsstrahlung produced in a scanning electron microscope. X‐Ray Spectrometry, 30(1), 37-43. en_US
dc.author.email msemaan@lau.edu.lb
dc.identifier.url http://onlinelibrary.wiley.com/doi/10.1002/xrs.465/abstract

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