dc.contributor.author |
Khalil, Antonio F. |
|
dc.date.accessioned |
2013-09-03T09:38:59Z |
|
dc.date.available |
2013-09-03T09:38:59Z |
|
dc.date.copyright |
2013 |
en_US |
dc.date.issued |
2013-09-03 |
|
dc.date.submitted |
2013-06-12 |
|
dc.identifier.uri |
http://hdl.handle.net/10725/1547 |
|
dc.description |
Includes bibligoraphical references (leaf 62). |
en_US |
dc.description.abstract |
Electronic Textile (e-textile) applications seem to obtain more and more importance in our daily lives; the huge amount of fabrics around us help electronic textile to mingle and integrate seamlessly with our daily life without interfering or changing our habits and lifestyles. Reliability is a very important factor for an electronic textile application especially in the fields of medicine, security and other fields where system failure is not tolerable and promptness of response is very delicate. The contributions of this study focus on defining a token grid networking scheme that enhances fault tolerance for electronic textile systems and increases the communication speed between the communicating components vis-à-vis other e-textile token grid topologies, it also presents a simulation environment used to examine and validate the defined topology. |
en_US |
dc.language.iso |
en |
en_US |
dc.subject |
Textile industry -- Data processing |
en_US |
dc.subject |
Textile fabrics -- Data processing |
en_US |
dc.subject |
Industrial engineering |
en_US |
dc.subject |
Computational grids (Computer systems) |
en_US |
dc.subject |
Lebanese American University -- Dissertations |
en_US |
dc.subject |
Dissertations, Academic |
en_US |
dc.title |
Bidirectional electronic textile token grid network topology. (c2013) |
en_US |
dc.type |
Thesis |
en_US |
dc.term.submitted |
Spring |
en_US |
dc.author.school |
Engineering |
en_US |
dc.author.idnumber |
200201428 |
en_US |
dc.author.commembers |
Wissam Fawaz |
en_US |
dc.author.woa |
OA |
en_US |
dc.author.department |
MSE in Computer Engineering |
en_US |
dc.description.physdesc |
1 bound copy: xv, 62 leaves; ill.; 31 cm. Available at RNL. |
en_US |
dc.author.division |
Computer Engineering |
en_US |
dc.author.advisor |
Zahi Nakad |
en_US |
dc.keywords |
Electronic Textiles |
en_US |
dc.keywords |
Token Grid |
en_US |
dc.keywords |
Network |
en_US |
dc.keywords |
Fault Tolerance |
en_US |
dc.keywords |
Minimization |
en_US |
dc.identifier.doi |
https://doi.org/10.26756/th.2013.12 |
en_US |