Bidirectional electronic textile token grid network topology. (c2013)

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dc.contributor.author Khalil, Antonio F.
dc.date.accessioned 2013-09-03T09:38:59Z
dc.date.available 2013-09-03T09:38:59Z
dc.date.copyright 2013 en_US
dc.date.issued 2013-09-03
dc.date.submitted 2013-06-12
dc.identifier.uri http://hdl.handle.net/10725/1547
dc.description Includes bibligoraphical references (leaf 62). en_US
dc.description.abstract Electronic Textile (e-textile) applications seem to obtain more and more importance in our daily lives; the huge amount of fabrics around us help electronic textile to mingle and integrate seamlessly with our daily life without interfering or changing our habits and lifestyles. Reliability is a very important factor for an electronic textile application especially in the fields of medicine, security and other fields where system failure is not tolerable and promptness of response is very delicate. The contributions of this study focus on defining a token grid networking scheme that enhances fault tolerance for electronic textile systems and increases the communication speed between the communicating components vis-à-vis other e-textile token grid topologies, it also presents a simulation environment used to examine and validate the defined topology. en_US
dc.language.iso en en_US
dc.subject Textile industry -- Data processing en_US
dc.subject Textile fabrics -- Data processing en_US
dc.subject Industrial engineering en_US
dc.subject Computational grids (Computer systems) en_US
dc.subject Lebanese American University -- Dissertations en_US
dc.subject Dissertations, Academic en_US
dc.title Bidirectional electronic textile token grid network topology. (c2013) en_US
dc.type Thesis en_US
dc.term.submitted Spring en_US
dc.author.school Engineering en_US
dc.author.idnumber 200201428 en_US
dc.author.commembers Wissam Fawaz en_US
dc.author.woa OA en_US
dc.author.department MSE in Computer Engineering en_US
dc.description.physdesc 1 bound copy: xv, 62 leaves; ill.; 31 cm. Available at RNL. en_US
dc.author.division Computer Engineering en_US
dc.author.advisor Zahi Nakad en_US
dc.keywords Electronic Textiles en_US
dc.keywords Token Grid en_US
dc.keywords Network en_US
dc.keywords Fault Tolerance en_US
dc.keywords Minimization en_US
dc.identifier.doi https://doi.org/10.26756/th.2013.12 en_US

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