Moments-based parametric sensitivity analysis of X-parameters

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dc.contributor.author Kassis, Marco T.
dc.contributor.author Tannir, Dani
dc.contributor.author Toukhtarian, Raffi
dc.contributor.author Khazaka, Roni
dc.date.accessioned 2020-07-17T07:15:32Z
dc.date.available 2020-07-17T07:15:32Z
dc.date.copyright 2019 en_US
dc.date.issued 2020-07-17
dc.identifier.issn 2156-3985 en_US
dc.identifier.uri http://hdl.handle.net/10725/11996
dc.description.abstract The polyharmonic distortion parameters of a nonlinear structure or circuit block, often referred to as X-parameters (X-parameters is a registered trademark of Agilent Technologies) relate the different harmonics of the incident waves to those of the reflected waves in the frequency domain. Recently, a closed-form derivative-based approach for calculating the X-parameters' sensitivity with respect to linear circuit elements has been developed for a given input amplitude level. In this article, we build on those results and present an efficient and accurate moment-based method for the sensitivity analysis with respect to both linear and nonlinear circuit parameters, parameterized with respect to the input amplitude. The proposed method allows for the accurate and efficient computation of Xparameter sensitivity terms without the need for CPU expensive sweeps or brute force perturbation. en_US
dc.language.iso en en_US
dc.title Moments-based parametric sensitivity analysis of X-parameters en_US
dc.type Article en_US
dc.description.version Published en_US
dc.author.school SOE en_US
dc.author.idnumber 201105274 en_US
dc.author.department Electrical And Computer Engineering en_US
dc.description.embargo N/A en_US
dc.relation.journal IEEE Transactions on Components, Packaging and Manufacturing Technology en_US
dc.journal.volume 9 en_US
dc.journal.issue 12 en_US
dc.article.pages 2451-2464 en_US
dc.keywords Harmonic balance (HB) moments en_US
dc.keywords Nonlinear radio-frequency (RF) circuits en_US
dc.keywords Polyharmonic distortion en_US
dc.keywords Sensitivity analysis en_US
dc.keywords X-parameters en_US
dc.identifier.doi https://doi.org/10.1109/TCPMT.2019.2947588 en_US
dc.identifier.ctation Kassis, M. T., Tannir, D., Toukhtarian, R., & Khazaka, R. (2019). Moments-Based Parametric Sensitivity Analysis of X-Parameters. IEEE Transactions on Components, Packaging and Manufacturing Technology, 9(12), 2451-2464. en_US
dc.author.email dani.tannir@lau.edu.lb en_US
dc.identifier.tou http://libraries.lau.edu.lb/research/laur/terms-of-use/articles.php en_US
dc.identifier.url https://ieeexplore.ieee.org/abstract/document/8869935 en_US
dc.orcid.id https://orcid.org/0000-0002-2049-4728 en_US
dc.author.affiliation Lebanese American University en_US

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